October 11, 2002—TSI Inc., a supplier of indoor environment monitors, has introduced the new Model CD5000 Controller designed for use with TSI’s Holix Diameter Gauges. The CD5000 Controller combines all the benefits of the Holix Diameter Measurement Gauges with a Windows-based software package to measure the diameter, ovality, width and thickness of extruded products.
It can also detect and record flaws or defects for a range of materials, including round, and non-round products like flat or triangular wire, cable and ribbons.
As part of a complete system, the CD5000 makes it easy to simplify the monitoring and controlling of production processes.
Other standard features of the system include a large display with touch-screen control, unlimited libraries available at no extra cost, tolerance checking, graphical representation of product size and position and a number of output options.
The system also enhances the benefits of TSI’s Holix Gauges, which feature the highest measurement rate of 2833/sec/axis; simultaneous flaw detection and diameter measurement; highly stable measurements; a large measurement range -38 m to 150 mm; and no calibration requirements.
For more information, contact TSI.
